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Realizzazione e Controllo di Dispositivi

The analytical equipment available to SYNCHIMIA is represented by all those intruiments usually present in high level organic labs (UV-VIS, FT-IR, GC, GC-MS, HPLC, MALDI-TOF, NMR, etc.).

Beside these techniques, SYNCHIMIA has ready access to the following scientific facilities that can be used for devices fabrication and characterization

 
Portable spectrometer
The portable UV-VIS spectrometer consists of a base unit containing a grating monochromator with three interchangeable and motorized slits. This unit is based on a CCD camera detector and an adapter for connection with optical fibers is also present. This set can be used for spectroscopic analysis of the radiation emitted by electroluminescent devices. The light emitted by these devices is directed towards the monocromator through the optical fiber and then its spectral components can be detected by the CCD camera. The system is interfaced with a PC using a special software, which allows to obtain the emission spectrum of the device.
 
Parametric Analyzer
The parametric analyzer is used to measure the I-V characteristics in both average power (with current <100mA) and high-power (current> 100mA), and includes the ability to operate in DC or AC with the resolution up to fA.

Parametric Analyzer

 
Glove box

Four gloves glove box for fabrication and testing in inert conditions (O2 and H2O <1 ppm) of devices based on organic semiconductors.


The glove box consists also of:

a) a spin coater inside the glove box for the deposition of organic materials in a controlled atmosphere with different control programs deposition (shear rate up to 12,000 rpm, clockwise and counterclockwise rotation and swinging);

b) a thermal evaporator, interfaced with the glove box and equipped with two crucibles for evaporation of organic substances and two for metals. The programmable system allows the deposition of the two types of materials on substrates up to 10 x 10 cm size with film thickness during growth. It is possible to rotate the sample to reach a greater uniformity of the film.


 
AFM

 

SYNCHIMIA is able to perform advanced characterization of thin films of optoelectronic materials by means of Atomic Force Microscopy (AFM). The instrument is equipped with a special acoustic enclosure that allows to obtain very detailed images even in the angstrom domain.

 

AFM system housed in the acustic enclousure

 
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Sito web realizzato da Giuliano Iacobellis per SYNCHIMIA (c) 2011

SYNCHIMIA srl
Dipartimento di Chimica, Università degli Studi “Aldo Moro” di Bari
Via E. Orabona, 4 I-70125 Bari
Tel. +39.080.544.2073 +39.080.544.2073 Fax. +39.080.544.2076